Electromigration Inside Logic Cells

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Gracieli Posser,Sachin S. Sapatnekar,Ricardo Reis

Engineering (R0)

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Idioma:English
ISBN:9783319488998
Fecha de lanzamiento:1 dic 2016
Editorial:Springer International Publishing

Edición:Springer
Formato de archivo:EPUB2
Tamaño de archivo:3.10 MB
Opciones de descarga:EPUB2 (Adobe DRM)

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Electromigration Inside Logic Cells

¿Por qué leer con nosotros?

Sinopsis

Acerca de este libro

Detalles del libro

Cómo leer

Lecturas relacionadas

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