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Interfacial Compatibility in Microelectronics - Moving Away from the Trial and Error Approach eBook by Toni T. Mattila,Mervi Paulasto-Kröckel,Tomi Laurila,Vesa Vuorinen,Jorma Kivilahti,Markus Turunen

Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

Toni T. Mattila,Mervi Paulasto-Kröckel,Tomi Laurila,Vesa Vuorinen,Jorma Kivilahti,Markus Turunen
Engineering (R0)

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About this book

  • Language:English
  • ISBN:9781447124702
  • Release date:Nov 10, 2017
  • Publisher:Springer London
  • Imprint:Springer
  • File format:EPUB2
  • File size:5.93 MB
  • Download options:EPUB2 (Adobe DRM)