This is the first textbook focusing on practicality of machine learning (ML) and deep neural networks (DNN), by introducing methods that enable engineering applications of ML and DNN models. The authors describe many methodologies that are widely used in designing, training, and deploying of these models and discuss their applicability under various contexts. Coverage begins with the basic knowledge of machine learning and deep neural networks and their applications in solving practical en...

The manufacture of flash memory, which is the dominant nonvolatile memory technology, is facing severe technical barriers. So much so, that some emerging technologies have been proposed as alternatives to flash memory in the nano-regime. Nonvolatile Memory Design: Magnetic, Resistive, and Phase Changing introduces three promising candidates: phase-change memory, magnetic random access memory, and resistive random access memory. The text illustrates the fundamental storage ...

Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectivesDescribes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memoryWritten by an authority in NAND flash memory technology, with over 25 years’ experience

Proven methods for noise-tolerant nanoscale integrated circuit designThis leading-edge guide discusses the impact of power integrity from a design perspective, emphasizing phenomena and problems induced by power integrity degradation and the latest design trends, including low-power design. Power Integrity for Nanoscale Integrated Systems describes how these problems can be forecast early in the design process and the countermeasures that can be used to address them, suc...

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

As power systems develop to incorporate renewable energy sources, the delivery systems may be disrupted by the changes involved. The grid’s technology and management must be developed to form Smart Grids between consumers, suppliers and producers. Conducted Electromagnetic Interference (EMI) in Smart Grids considers the specific side effects related to electromagnetic interference (EMI) generated by the application of these Smart Grids.Conducted Electromagnetic Interference (EMI) in...

Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufa...

Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the i...

Industrial Process Identification and Control Design is devoted to advanced identification and control methods for the operation of continuous-time processes both with and without time delay, in industrial and chemical engineering practice. The simple and practical step- or relay-feedback test is employed when applying the proposed identification techniques, which are classified in terms of common industrial process type: open-loop stable; integrating; and unstable, respectively. Correspon...

Whether you are an RF transistor designer, an amplifier designer or a system designer, this is your one-stop guide to RF and microwave transistor power amplifiers. A team of expert authors brings you up to speed on every topic, including: devices (Si LDMOS and VDMOS, GaAs FETs, GaN HEMTs), circuit and amplifier design (discrete, hybrid and monolithic), CAD, thermal design, reliability, and system applications/requirements for RF and microwave transistor amplifiers. Covering state-of-the-ar...

Unifying Electrical Engineering and Electronics Engineering is based on the Proceedings of the 2012 International Conference on Electrical and Electronics Engineering (ICEE 2012). This book collects the peer reviewed papers presented at the conference. The aim of the conference is to unify the two areas of Electrical and Electronics Engineering. The book examines trends and techniques in the field as well as theories and applications. The editors have chosen to include the following topics...

This book will appeal to scientists and engineers who are concerned with the design of microwave wideband devices and systems. For advanced (ultra)-wideband wireless systems, the necessity and design methodology of wideband filters will be discussed with reference to the inherent limitation in fractional bandwidth of classical bandpass filters. Besides the detailed working principles, a large number of design examples are demonstrated, which can be easily followed and modified by the reade...