This book acts as a handbook on the topic of x-ray scattering as applied to epitaxial complex oxide films, providing detailed information to collect the data, how to analyze the data and the practical sides of the experiments. The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffra...