Showing results for "mario lanza"
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Conductive Atomic Force Microscopy
Applications in Nanomaterials
2017
EN
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.With its substantial content and logical structure, this is a valuable ...
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Energy Storage
Fundamentals, Materials and Applications
- Series -
- Energy (R0)
2015
EN
Energy Storage explains the underlying scientific and engineering fundamentals of all major energy storage methods. These include the storage of energy as heat, in phase transitions and reversible chemical reactions, and in organic fuels and hydrogen, as well as in mechanical, electrostatic and magnetic systems. Updated coverage of electrochemical storage systems considers exciting developments in materials and methods for applications such as rapid short-term storage in hybrid and intermi...
Subsecond Annealing of Advanced Materials
Annealing by Lasers, Flash Lamps and Swift Heavy Ions
- Series -
- Chemistry and Material Science (R0)
2013
EN
The thermal processing of materials ranges from few fem to seconds by Swift Heavy Ion Implantation to about one second using advanced Rapid Thermal Annealing. This book offers after an historical excursus selected contributions on fundamental and applied aspects of thermal processing of classical elemental semiconductors and other advanced materials including nanostructures with novel optoelectronic, magnetic, and superconducting properties. Special emphasis is given on the diffusion and s...
2009
EN
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.The latest in organic electronics-based sensing and biotechnologyDevelop high-performance, field-deployable organic semiconductor-based biological, chemical, and physical sensor arrays using the comprehensive information contained in this definitive volume...
Semiconductor Laser Engineering, Reliability and Diagnostics
A Practical Approach to High Power and Single Mode Devices
2013
EN
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatm...
Optofluidics: Fundamentals, Devices, and Applications
Fundamentals, Devices, and Applications
2009
EN
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.Cutting-Edge Optofluidics Theories, Techniques, and PracticesAdd novel functionalities to your optical design projects by incorporating state-of-the-art microfluidic technologies and tools. Co-written by industry experts, Optofluidics: Fundamentals, De...
- Series -
- Chemistry and Material Science (R0)
2014
EN
This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications ...
2013
EN
Frontiers in Electronics is divided into four sections: advanced terahertz and photonics devices; silicon and germanium on insulator and advanced CMOS and MOSHFETs; nanomaterials and nanodevices; and wide band gap technology for high power and UV photonics. This book will be useful for nano-microelectronics scientists, engineers, and visionary research leaders. It is also recommended to graduate students working at the frontiers of the nanoelectronics and microscience.
Thin Film Shape Memory Alloys
Fundamentals and Device Applications
2009
EN
This book, the first dedicated to this exciting and rapidly growing field, enables readers to understand and prepare high-quality, high-performance TiNi shape memory alloys (SMAs). It covers the properties, preparation and characterization of TiNi SMAs, with particular focus on the latest technologies and applications in MEMS and biological devices. Basic techniques and theory are covered to introduce new-comers to the subject, whilst various sub-topics, such as film deposition, characteri...
2012
EN
Nanoscale and nanostructured materials have exhibited different physical properties from the corresponding macroscopic coarse-grained materials due to the size confinement. As a result, there is a need for new techniques to probe the mechanical behavior of advanced materials on the small scales. Micro and Nano Mechanical Testing of Materials and Devices presents the latest advances in the techniques of mechanical testing on the micro- and nanoscales, which are nec...
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- Chemistry and Material Science (R0)
2009
EN
In my career I’ve found that ‘‘thinking outside the box’’ works better if I know what’s ‘‘inside the box.’’ Dave Grusin, composer and jazz musician Different people think in different time frames: scientists think in decades, engineers think in years, and investors think in quarters. Stan Williams, Director of Quantum Science Research, Hewlett Packard Laboratories Everything can be made smaller, never mind physics; Everything can be made more ef?cient, never mind thermodynamics; Everything...
Defect Recognition and Image Processing in Semiconductors 1997
Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997
2017
EN
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects...











